Electron Microscopy Facilities

JEM 2100 TEM

Location: MR 021C
Facility Manager: Dr. Jorge Morales

Our JEOL JEM2100 is a termionic (LaB6) TEM with a point to point resolution of 0.23 nm and a line resolution of 0.14 nm. It operates at a maximum voltage of 200 kV in Cryo and room temperature. Images can be acquired on film or in any of two digital cameras: Gatan Ultrascan 1000XP or Gatan Orius SC200.

The system can also be used for Scanning Transmission Electron Microscopy (STEM) and will provide a resolution of 1 nm in STEM mode.  The JEM2100 is also fitted with an Inca Energy Dispersive X-ray Spectrometer (EDS) system, which has an 80 mm2 crystal and an energy resolution of 129eV. The combination of STEM and EDS makes it a useful tool to analyze materials samples.

More info...

Zeiss Supra 55 SEM

Location: MR 022
Facility Manager: Dr. Jorge Morales

The Zeiss Supra 55 is a field emission SEM with a maximum resolution of 1 nm. It has the following capabilities: secondary and backscattered electron imaging in high vacuum or in variable pressure mode, scanning transmission electron microscopyimaging, electron beam lithography, energy dispersive x-ray spectrometry (EDS) andelectron backscatter diffraction (EBSD). 

More info...

Last Updated: 01/27/2022 10:55