Zeiss Supra 55 SEM

Location

Marshak Science Building, Room 022
The City College of New York
160 Convent Ave, New York, NY 10031

Staff

Jorge Morales Ph.D.
jmorales@ccny.cuny.edu
Phone:  (212) 650 8591
Cell: (347) 398 1846

Scheduling

CCNY Corelabs booking system.

Fees

• Federal Rate: $40/h
• Non-Federal Rate: $94/h
• CCNY (internal) Rate: $26/h

Facility Images

About the Facility

The Zeiss Supra 55 is a field emission SEM with a maximum resolution of 1 nm.

It has the following capabilities:

• Secondary and backscattered electron imaging in high vacuum or in variable pressure mode
• Scanning transmission electron microscopy imaging
• Energy dispersive x-ray spectrometry (EDS)
• Electron backscatter diffraction (EBSD). 

To start using our SEM schedule a meeting with Dr. Morales ( jmorales@ccny.cuny.edu ).

The Zeiss Supra 55 VP was purchased in 2008 with funding provided by the State of New York through the City University of New York (CUNY).

About SEM

The types of signals produced by an SEM include secondary electrons, backscattered electrons and characteristic x-rays. These signals come from the interaction of the beam of electrons with the surface of the specimen.

In its primary detection mode, secondary electron imaging, the SEM can produce very high-resolution images of a sample surface, revealing details about 1 to 10 nm in size.

Energy-dispersive spectroscopy (EDS) makes use of characteristic x-rays and are the second most common use of an SEM. X-rays are emitted when the electron beam removes an electron from the sample, causing a higher energy electron to fill the shell giving off x-rays. These x-rays are used to identify the elemental composition of the sample.

Backscattered electrons (BSE) that come from the sample may also be used to form an image with atomic number contrast. BSE images are often used in analytical mode giving an image with compositional contrast in high vacuum for conductive samples as well as in variable pressure for non-conductive samples.