Surface Science Facility


The Surface Science Facility offers access and services to state-of-the- art surface analysis instrumentation including X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (TOF- SIMS), atomic force microscopy (AFM), and thermochemical nanolithography (TCNL). With a range of sample preparation chambers, hardware configurations, and in-house expertise, researchers in the physical sciences have the capability to prepare and analyze a variety of different sample types, including immobilized biological, organic, inorganic, and mixed composition samples.



Surface Science Facility Manager Tai-De Li at  

Facility Structure

The Surface Science Facility encourage researchers to get trained to become a user of the facility. Click here to find instructions and the forms necessary to become a user. A full list of instrument user rates can be found here.


The Surface Science Facility at the CUNY ASRC offers cutting-edge surface analyzing instruments for academic and industrial researchers. The facility currently has three core instruments: (1) X-ray photoelectron spectroscopy (XPS) to measure the elemental composition, empirical formula, chemical state, and electronic state of sample surface; (2) time-of-flight secondary ion mass spectrometer (TOF-SIMS) to perform elemental trace measurements of the top atomic layers of the sample surface; and (3) atomic force microscopy (AFM) to image surface topography and stiffness with nanometer resolution in air and liquid environments. To view the instruments available in the Rodent Behavioral Analysis Suiteplease click here, and to view the equipment rates, follow here. Please look at the following link for information how to become a user of the facility:

Last Updated: 09/22/2023 14:04